Microelectronics failure analysis [electronic resource] : desk reference / edited by Richard J. Ross.
Material type:
TextPublication details: Materials Park, Ohio : ASM International, c2011.Edition: 6th edDescription: xi, 660 p. : illSubject(s): - Electronics -- Materials -- Testing -- Handbooks, manuals, etc
- Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc
- Microelectronics -- Materials -- Defects -- Handbooks, manuals, etc
- Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc
- Semiconductors -- Defects -- Handbooks, manuals, etc
- 621.381 23
- TK7871 .M52 2011
Includes bibliographical references and indexes.
section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
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