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Leakage current and defect characterization of short channel MOSFETs /

Roll, Guntrade,

Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll. - 1 online resource (242 pages). - Research at NaMLab ; 2 .

ISBN: 9783832596668 (e-book)

Subjects--Topical Terms:
Metal oxide semiconductor field-effect transistors.

Index Terms--Genre/Form:
Electronic books.

LC Class. No.: TK7871.95 / .R655 2014

Dewey Class. No.: 621.3815284

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