Power-constrained testing of VLSI circuits
Nicolici, Nicola.
Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. - Boston : Kluwer Academic Publishers, c2003. - xi, 178 p. : ill. - Frontiers in electronic testing ; 22 . - Frontiers in electronic testing ; 22. .
Includes bibliographical references (p. 163-173) and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Protection.
Semiconductors--Thermal properties.
Electronic books.
TK7874.75 / .N53 2003
621.39/5/0287
Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. - Boston : Kluwer Academic Publishers, c2003. - xi, 178 p. : ill. - Frontiers in electronic testing ; 22 . - Frontiers in electronic testing ; 22. .
Includes bibliographical references (p. 163-173) and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Protection.
Semiconductors--Thermal properties.
Electronic books.
TK7874.75 / .N53 2003
621.39/5/0287