ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International.

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TextPublication details: Materials Park, OH : Asm International, c2008.Description: xx, 528 p. : illOther title:

Proceedings of the 34th International Symposium for Testing and Failure Analysis
34th International Symposium for Testing and Failure Analysis
Thirty-fourth International Symposium for Testing and Failure Analysis

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Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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