ISTFA 2008  conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /  [electronic resource] : 
 Proceedings of the 34th International Symposium for Testing and Failure Analysis  34th International Symposium for Testing and Failure Analysis  Thirty-fourth International Symposium for Testing and Failure Analysis 
sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. 
 - Materials Park, OH :  Asm International,  c2008. 
 - xx, 528 p. :  ill. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronics--Materials--Testing--Congresses.<br/>Electronic apparatus and appliances--Testing--Congresses.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7871  / .I68 2008