Roll, Guntrade, <br/><br/>
Leakage current and defect characterization of short channel MOSFETs / 
Guntrade Roll. 
 - 1 online resource (242 pages). 
 - Research at NaMLab ;  2 .
<br/><br/><label>ISBN: </label>9783832596668 (e-book) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductor field-effect transistors.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7871.95  / .R655 2014 
<br/><br/><label>Dewey Class. No.: </label>621.3815284