Nicolici, Nicola. <br/><br/>
Power-constrained testing of VLSI circuits  [electronic resource] / 
by Nicola Nicolici and Bashir M. Al-Hashimi. 
 - Boston :  Kluwer Academic Publishers,  c2003. 
 - xi, 178 p. :  ill. 
 - Frontiers in electronic testing ;  22 .
 - Frontiers in electronic testing ;  22. .
<br/><br/>Includes bibliographical references (p. 163-173) and index. 
<br/><br/><br/>Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
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<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Testing.<br/>Integrated circuits--Very large scale integration--Protection.<br/>Semiconductors--Thermal properties.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7874.75  / .N53 2003 
<br/><br/><label>Dewey Class. No.: </label>621.39/5/0287