TY  - BOOK
AU  - Nicolici,Nicola
AU  - Al-Hashimi,Bashir
ED  - ProQuest (Firm)
TI  - Power-constrained testing of VLSI circuits
T2  - Frontiers in electronic testing
AV  - TK7874.75 .N53 2003
U1  - 621.39/5/0287 21
PY  - 2003///
CY  - Boston
PB  - Kluwer Academic Publishers
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Protection
KW  - Semiconductors
KW  - Thermal properties
KW  - Electronic books
N1  - Includes bibliographical references (p. 163-173) and index; Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries
UR  - https://ebookcentral.proquest.com/lib/nird-ebooks/detail.action?docID=3035841
ER  -