Your search returned 36 results.

Results
	21.	ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA / sponsored by Electronic Device Failure Analysis Society. by International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California) Electronic Device Failure Analysis Society [sponsor.] Material type: Text; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2013Copyright date: �2013 Online resources: Click to View Availability: No items available. Add to cart (remove)
	22.	ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / organized by Electronic Device Failure Analysis Society, ASM International. by International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.) Electronic Device Failure Analysis Society [organizer.] ASM International [organizer.] Material type: Text; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2014Copyright date: �2014 Online resources: Click to View Availability: No items available. Add to cart (remove)
	23.	No cover image available No cover image available EMC for product designers [electronic resource] / Tim Williams. by Williams, Tim, 1954- ProQuest (Firm) Edition: 4th ed. Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Oxford : Newnes, 2007 Online resources: Click to View Availability: No items available. Add to cart (remove)
	24.	No cover image available No cover image available Knowledge-based intelligent information engineering systems and allied technologies [electronic resource] : KES 2002 / edited by E. Damiani ... [et al.]. by International Conference on Knowledge-Based Intelligent Information and Engineering Systems (2002 : University of Milan) Damiani, Ernesto ProQuest (Firm) Series: Frontiers in artificial intelligence and applications ; v. 82. Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Amsterdam ; Washington, DC : IOS Press/Ohmsha, c2002 Online resources: Click to View Availability: No items available. Add to cart (remove)
	25.	No cover image available No cover image available Electronic components and processes [electronic resource] / Preeti Maheshwari. by Maheshwari, Preeti ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: New Delhi : New Age International, c2006 Online resources: Click to View Availability: No items available. Add to cart (remove)
	26.	No cover image available No cover image available Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. by Nadeau-Dostie, Benoit ProQuest (Firm) Series: Frontiers in electronic testing Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Boston : Kluwer Academic, c2000 Online resources: Click to View Availability: No items available. Add to cart (remove)
	27.	No cover image available No cover image available A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E ProQuest (Firm) Series: Frontiers in electronic testing Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2002 Online resources: Click to View Availability: No items available. Add to cart (remove)
	28.	No cover image available No cover image available Boundary-scan interconnect diagnosis [electronic resource] / Jos�e T. de Sousa, Peter Y.K. Cheung. by Sousa, Jos�e T. de Cheung, Peter Y. K ProQuest (Firm) Series: Frontiers in electronic testing ; 18. Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2001 Online resources: Click to View Availability: No items available. Add to cart (remove)
	29.	No cover image available No cover image available High tech trash [electronic resource] : digital devices, hidden toxics, and human health / Elizabeth Grossman. by Grossman, Elizabeth, 1957- ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Washington : Island Press : Shearwater Books, c2006 Other title: Digital devices, hidden toxics, and human health Online resources: Click to View Availability: No items available. Add to cart (remove)
	30.	No cover image available No cover image available Hertzian tales [electronic resource] : electronic products, aesthetic experience, and critical design / Anthony Dunne. by Dunne, Anthony ProQuest (Firm) Edition: [2005 ed.] Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Cambridge, Mass. : MIT Press, c2005 Online resources: Click to View Availability: No items available. Add to cart (remove)
	31.	No cover image available No cover image available Electronic devices and amplifier circuits with MATLAB� / Simulink� / SimElectronics � examples [electronic resource] / Steven T. Karris. by Karris, Steven T ProQuest (Firm) Edition: 3rd ed. Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: [Fremont, CA] : Orchard Publications, c2012 Online resources: Click to View Availability: No items available. Add to cart (remove)
	32.	No cover image available No cover image available Digital rubbish [electronic resource] : natural history of electronics / Jennifer Gabrys. by Gabrys, Jennifer ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Ann Arbor, Mich. : University of Michigan Press, c2011 Online resources: Click to View Availability: No items available. Add to cart (remove)
	33.	System level ESD co-design / edited by Charvaka Duvvury, Harald Gossner. by Duvvury, Charvaka [editor.] Gossner, Harald [editor.] Material type: Text; Literary form: Not fiction Publisher: West Sussex, England : Wiley-IEEE Press, 2015Copyright date: �2015 Online resources: Click to View Availability: No items available. Add to cart (remove)
	34.	Multiscreen UX design : developing for a multitude of devices / Wolfram Nagel. by Nagel, Wolfram [author.] Material type: Text; Literary form: Not fiction Publisher: Waltham, Massachusetts : Morgan Kaufmann, 2016Copyright date: �2016 Online resources: Click to View Availability: No items available. Add to cart (remove)
	35.	ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International. by International Symposium for Testing and Failure Analysis (41st : 2015 : Portland, Oregon) [organizer.] ASM International [organizer.] Electronic Device Failure Analysis Society [organizer.] Material type: Text; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, [2015]Copyright date: �2015 Online resources: Click to View Availability: No items available. Add to cart (remove)
	36.	Modern devices : the simple physics of sophisticated technology / by Charles L. Joseph and Santiago Bernal. by Joseph, Charles Lynn [author.] Bernal, Santiago [author.] Material type: Text; Literary form: Not fiction Publisher: Hoboken, New Jersey : Wiley, 2016Copyright date: �2016 Online resources: Click to View Availability: No items available. Add to cart (remove)

Installed and Supported by focuz infotech