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	21.	No cover image available No cover image available ISTFA '99 [electronic resource] : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California. by International Symposium for Testing and Failure Analysis (25th : 1999 : Santa Clara, Calif.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, c1999 Other title: Proceedings of the 25th International Symposium or Testing and Failure Analysis Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis Online resources: Click to View Availability: No items available. Add to cart (remove)
	22.	No cover image available No cover image available ISTFA 2005 [electronic resource] : Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International. by International Symposium for Testing and Failure Analysis (31st : d2005 : San Jose, Calif.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, c2005 Online resources: Click to View Availability: No items available. Add to cart (remove)
	23.	No cover image available No cover image available ISTFA '97 [electronic resource] : proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California / sponsored by ASM International. by International Symposium for Testing and Failure Analysis (23rd : 1997 : Santa Clara, Calif.) Davidson, Grace M ASM International ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, c1997 Other title: 23rd international symposium for testing and failure analysis Online resources: Click to View Availability: No items available. Add to cart (remove)
	24.	No cover image available No cover image available ISTFA '98 [electronic resource] : proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas / sponsored by ISFTA, ASM International. by International Symposium for Testing and Failure Analysis (24th : 1998 : Dallas, Tex.) ASM International ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, c1998 Other title: Proceedings of the 24th International Symposium for Testing and Failure Analysis Conference proceedings from the 24th International Symposium for Testing and Failure Analysis Online resources: Click to View Availability: No items available. Add to cart (remove)
	25.	No cover image available No cover image available ISTFA '96 [electronic resource] : proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California. by International Symposium for Testing and Failure Analysis (22nd : 1996 : Los Angeles, Calif.) ASM International. Electronic Materials and Processing Division ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, c1996 Online resources: Click to View Availability: No items available. Add to cart (remove)
	26.	No cover image available No cover image available ISTFA 2004 [electronic resource] : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International. by International Symposium for Testing and Failure Analysis (30th : 2004 : Boston, Mass.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, c2004 Online resources: Click to View Availability: No items available. Add to cart (remove)
	27.	No cover image available No cover image available Medical device materials II [electronic resource] : proceedings from the Materials & Processes for Medical Devices Conference 2004, August 25-27, 2004, St. Paul Minnesota / edited by Mike Helmus, Dana Medlin ; sponsored by ASM International. by Materials & Processes for Medical Devices Conference (2nd : 2004 : Saint Paul, Minn.) Helmus, Michael Nevin Medlin, Dana ASM International ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, c2005 Online resources: Click to View Availability: No items available. Add to cart (remove)
	28.	No cover image available No cover image available ISTFA 2006 [electronic resource] : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. by International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.) ASM International ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, 2006 Other title: Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis Online resources: Click to View Availability: No items available. Add to cart (remove)
	29.	No cover image available No cover image available ISTFA 2003 [electronic resource] : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2003 Other title: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003 Conference proceedings from the 29th International Symposium for Testing and Failure Analysis Online resources: Click to View Availability: No items available. Add to cart (remove)
	30.	No cover image available No cover image available Microelectronic failure analysis [electronic resource] : desk reference. 2002 supplement / prepared under the direction of the Electronic Device Failure Analysis Society publications committee. by Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, c2002 Online resources: Click to View Availability: No items available. Add to cart (remove)
	31.	No cover image available No cover image available ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. by International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : Asm International, 2009 Online resources: Click to View Availability: No items available. Add to cart (remove)
	32.	No cover image available No cover image available Biomaterials in orthopaedic surgery [electronic resource] / Federico �Angel Rodr�iguez-Gonz�alez. by Rodriguez-Gonzalez, Federico �Angel ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2009 Online resources: Click to View Availability: No items available. Add to cart (remove)
	33.	No cover image available No cover image available ISTFA 2010 [electronic resource] : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International. by International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2010 Online resources: Click to View Availability: No items available. Add to cart (remove)
	34.	No cover image available No cover image available Materials selection for corrosion control [electronic resource] / Sohan L. Chawla and Rajeshwar K. Gupta ; acquisitions editor, Mary Thomas Haddad ; production project manager, Suzanne E. Hampson ; production/design, Randall L. Boring. by Chawla, Sohan L Gupta, Rajeshwar K Haddad, Mary Thomas Hampson, Suzanne E Boring, Randall L ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, c1993 Online resources: Click to View Availability: No items available. Add to cart (remove)
	35.	No cover image available No cover image available Structural composite materials [electronic resource] / F.C. Campbell. by Campbell, F. C ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2010 Online resources: Click to View Availability: No items available. Add to cart (remove)
	36.	No cover image available No cover image available Medical device materials [electronic resource] : proceedings of the Materials and Processes for Medical Devices Conference 2009, August 10-12, 2009 Minneapolis, Minn., USA / edited by Jeremy Gilbert. V. by Materials & Processes for Medical Devices Conference (2009 : Minneapolis, Minn.) Gilbert, Jeremy ProQuest (Firm) Series: Medical device materials Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2010 Online resources: Click to View Availability: No items available. Add to cart (remove)
	37.	No cover image available No cover image available Advances in materials technology for fossil power plants [electronic resource] : proceedings from the sixth International Conference, August 31-September 3, 2010, Santa Fe, New Mexico, USA / editors, D. Gandy, J. Shingledecker, R. Viswanathan ; sponsored by EPRI ... [et al.]. by International Conference on Advances in Materials Technology for Fossil Power Plants (6th : 2010 : Santa Fe, N.M.) Gandy, D. (David) Shingledecker, J Viswanathan, Ramaswamy Electric Power Research Institute ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, c2011 Online resources: Click to View Availability: No items available. Add to cart (remove)
	38.	No cover image available No cover image available Models, databases, and simulation tools needed for the realization of integrated computational materials engineering [electronic resource] : proceedings of the symposium held at Materials Science & Technology 2010, October 18-20, 2010, Houston, Texas, USA / sponsored by ASM Materials Properties Database Committee ; edited by Steven M. Arnold and Terry T. Wong. by Materials Science & Technology Conference (2010 : Houston, Tex.) Arnold, S. M Wong, Terry T ASM International. Materials Properties Database Committee ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, c2011 Online resources: Click to View Availability: No items available. Add to cart (remove)
	39.	No cover image available No cover image available Microelectronics failure analysis [electronic resource] : desk reference / edited by Richard J. Ross. by Ross, Richard J ProQuest (Firm) Edition: 6th ed. Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, c2011 Online resources: Click to View Availability: No items available. Add to cart (remove)
	40.	No cover image available No cover image available ISTFA 2011 [electronic resource] : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. by International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2011 Online resources: Click to View Availability: No items available. Add to cart (remove)

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