Results of search for 'ccl=su:"Testing."' › National Institute of Rural Development and Panchayati Raj catalog

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	21.	No cover image available No cover image available ISTFA 2006 [electronic resource] : proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA. by International Symposium for Testing and Failure Analysis (23rd : 2006 : Austin, Tex.) ASM International ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, 2006 Other title: Proceedings of the 32nd International Symposium for Testing and Failure Analysis Conference proceedings from the 32nd International Symposium for Testing and Failure Analysis Online resources: Click to View Availability: No items available. Add to cart (remove)
	22.	No cover image available No cover image available ISTFA 2003 [electronic resource] : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by International Symposium for Testing and Failure Analysis (29th : 2003 : Santa Clara, Calif.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2003 Other title: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003 Conference proceedings from the 29th International Symposium for Testing and Failure Analysis Online resources: Click to View Availability: No items available. Add to cart (remove)
	23.	No cover image available No cover image available Microelectronic failure analysis [electronic resource] : desk reference. 2002 supplement / prepared under the direction of the Electronic Device Failure Analysis Society publications committee. by Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, OH : ASM International, c2002 Online resources: Click to View Availability: No items available. Add to cart (remove)
	24.	No cover image available No cover image available ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. by International Symposium for Testing and Failure Analysis (35th : 2009 : San Jose, Calif.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : Asm International, 2009 Online resources: Click to View Availability: No items available. Add to cart (remove)
	25.	No cover image available No cover image available ISTFA 2010 [electronic resource] : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International. by International Symposium for Testing and Failure Analysis (36th : 2010 : Dallas, Tex.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2010 Online resources: Click to View Availability: No items available. Add to cart (remove)
	26.	No cover image available No cover image available Hardness testing [electronic resource] : principles and applications / edited by Konrad Herrmann. by Herrmann, Konrad ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2011 Online resources: Click to View Availability: No items available. Add to cart (remove)
	27.	No cover image available No cover image available Microelectronics failure analysis [electronic resource] : desk reference / edited by Richard J. Ross. by Ross, Richard J ProQuest (Firm) Edition: 6th ed. Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, c2011 Online resources: Click to View Availability: No items available. Add to cart (remove)
	28.	No cover image available No cover image available ISTFA 2011 [electronic resource] : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. by International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.) ASM International Electronic Device Failure Analysis Society ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2011 Online resources: Click to View Availability: No items available. Add to cart (remove)
	29.	No cover image available No cover image available Structural life assessment methods [electronic resource] / A.F. Liu. by Liu, A. F ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 1998 Other title: Life assessment methods Online resources: Click to View Availability: No items available. Add to cart (remove)
	30.	No cover image available No cover image available ISTFA 2012 [electronic resource] : conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA. by International Symposium for Testing and Failure Analysis (38th : 2012 : Phoenix Convention Center) ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: Materials Park, Ohio : ASM International, 2012 Online resources: Click to View Availability: No items available. Add to cart (remove)
	31.	Inspection of metals : understanding the basics / edited by F. C. Campbell. by Campbell, F. C [editor.] Material type: Text; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2013Copyright date: �2013 Online resources: Click to View Availability: No items available. Add to cart (remove)
	32.	ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA / sponsored by Electronic Device Failure Analysis Society. by International Symposium for Testing and Failure Analysis (39th : 2013 : San Jose, California) Electronic Device Failure Analysis Society [sponsor.] Material type: Text; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2013Copyright date: �2013 Online resources: Click to View Availability: No items available. Add to cart (remove)
	33.	ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / organized by Electronic Device Failure Analysis Society, ASM International. by International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.) Electronic Device Failure Analysis Society [organizer.] ASM International [organizer.] Material type: Text; Literary form: Not fiction Publisher: Materials Park, Ohio : ASM International, 2014Copyright date: �2014 Online resources: Click to View Availability: No items available. Add to cart (remove)
	34.	HALT, HASS, and HASA explained : accelerated reliability techniques / Harry W. McLean. by McLean, Harry W, 1946- [author.] Edition: Revised edition. Material type: Text; Literary form: Not fiction Publisher: Milwaukee, Wisconsin : ASQ Quality Press, 2009 Online resources: Click to View Availability: No items available. Add to cart (remove)
	35.	No cover image available No cover image available Drug testing in law enforcement agencies [electronic resource] : social control in the public sector / James R. Brunet. by Brunet, James R, 1966- ProQuest (Firm) Series: Criminal justice (LFB Scholarly Publishing LLC) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: New York : LFB Scholarly Pub., 2005 Online resources: Click to View Availability: No items available. Add to cart (remove)
	36.	No cover image available No cover image available Handbook of verbal reasoning [electronic resource] : [useful for U.P.S.C., I.A.S., N.D.A., C.D.S., B.C.S. & other major competitive exams] / Surendra Nath Banerjee. by Bandyopadhyay, Surendranath ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: New Delhi : New Age International, 2008 Online resources: Click to View Availability: No items available. Add to cart (remove)
	37.	No cover image available No cover image available Rock mechanics [electronic resource] : new research / M. Abbie and J.S. Bedford, editors. by Abbie, M, 1958- Bedford, J. S, 1959- ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: New York : Nova Science Publishers, c2009 Online resources: Click to View Availability: No items available. Add to cart (remove)
	38.	No cover image available No cover image available Nondestructive testing [electronic resource] : methods, analyses and applications / Earl N. Mallory, editor. by Mallory, Earl N ProQuest (Firm) Series: Mechanical engineering theory and applications Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: New York : Nova Science Publishers, c2010 Online resources: Click to View Availability: No items available. Add to cart (remove)
	39.	No cover image available No cover image available Introduction of intelligent machine fault diagnosis and prognosis [electronic resource] / Bo-Suk Yang and Achmad Widodo. by Yang, O-Suk Widodo, Achmad ProQuest (Firm) Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: New York : Nova Science Publishers, c2009 Online resources: Click to View Availability: No items available. Add to cart (remove)
	40.	No cover image available No cover image available Recent advances in non-destructive inspection [electronic resource] / Carosena Meola, editor. by Meola, Carosena ProQuest (Firm) Series: Materials science and technologies Material type: Text; Format: electronic ; Literary form: Not fiction Publication details: New York : Nova Science Publishers, c2010 Other title: Recent advances in nondestructive inspection Online resources: Click to View Availability: No items available. Add to cart (remove)

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Your search returned 209 results.