Amazon cover image
Image from Amazon.com
Image from Google Jackets

Metrology and standardization for nanotechnology : protocols and industrial innovations / edited by Elisabeth Mansfield [and three others].

Contributor(s): Material type: TextTextSeries: Nanotechnology innovation & applicationsPublisher: Weinheim : Wiley-VCH, [2017]Copyright date: �2017Description: 1 online resource (629 pages) : illustrations (some color)Content type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783527800292 (e-book)
Subject(s): Genre/Form: LOC classification:
  • T174.7 .M48 2017
Online resources:
Reviews from LibraryThing.com:
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Includes bibliographical references and index.

Description based on online resource; title from PDF title page (ebrary, viewed February 14, 2017).

Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

There are no comments on this title.

to post a comment.
Installed and Supported by focuz infotech