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Results of search for 'su:"Defects."'
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Authors
Davis, J. R.
Ehrt, Doris
Fisher, D. J.
Moncke, Doris
National Research Co...
Ross, Richard J.
Simon, Lea M.
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Series
Engineering tools, t...
Materials science an...
Special report
Topics
Automobiles
Consumer education
Corrosion and anti-c...
Defects
Diffusion processes
Electronic apparatus...
Electronics
Fault location (Engi...
Glass
Metals
Microelectronics
Photoionization
Polyvalent molecules
Semiconductors
Titanium dioxide
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GANDHIAN BOOKS
Sept New Arrivals
New arrivals books-May-2024
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1.
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Microelectronic failure analysis
[electronic resource] :
desk reference : 2001 supplement /
prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee.
by
Electronic Device Failure Analysis Society
ProQuest (Firm)
Material type:
Text
; Format:
electronic
; Literary form:
Not fiction
Publication details:
Materials Park, OH :
ASM International,
c2001
Online resources:
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Availability:
No items available.
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2.
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Corrosion
[electronic resource] :
understanding the basics /
edited by J.R. Davis.
by
Davis, J. R. (Joseph R.)
ProQuest (Firm)
Material type:
Text
; Format:
electronic
; Literary form:
Not fiction
Publication details:
Materials Park, OH :
ASM International,
2000
Online resources:
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Availability:
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3.
No cover image available
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Microelectronic failure analysis
[electronic resource] :
desk reference. 2002 supplement /
prepared under the direction of the Electronic Device Failure Analysis Society publications committee.
by
Electronic Device Failure Analysis Society
ProQuest (Firm)
Material type:
Text
; Format:
electronic
; Literary form:
Not fiction
Publication details:
Materials Park, OH :
ASM International,
c2002
Online resources:
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Availability:
No items available.
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4.
No cover image available
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Microelectronics failure analysis
[electronic resource] :
desk reference /
edited by Richard J. Ross.
by
Ross, Richard J
ProQuest (Firm)
Edition:
6th ed.
Material type:
Text
; Format:
electronic
; Literary form:
Not fiction
Publication details:
Materials Park, Ohio :
ASM International,
c2011
Online resources:
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5.
No cover image available
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Fault detection
[electronic resource] :
theory, methods and systems /
Lea M. Simon, editor.
by
Simon, Lea M
ProQuest (Firm)
Series:
Engineering tools, techniques and tables
Material type:
Text
; Format:
electronic
; Literary form:
Not fiction
Publication details:
New York :
Nova Science Publishers,
c2011
Online resources:
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6.
No cover image available
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Photoionization of polyvalent ions
[electronic resource] /
Doris M�oncke and Doris Ehrt.
by
Moncke, Doris
Ehrt, Doris
ProQuest (Firm)
Series:
Materials science and technologies series
Material type:
Text
; Format:
electronic
; Literary form:
Not fiction
Publication details:
New York :
Nova Science Publishers,
c2010
Online resources:
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7.
Diffusion and defects in TiO2 : a compilation /
edited by D. J. Fisher.
by
Fisher, D. J
Material type:
Text
; Literary form:
Not fiction
Publisher:
[Durnten-Zurich] :
Trans Tech Publications,
[2013]
Other title:
Diffusion and defects in titanium dioxide
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8.
No cover image available
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Shopping for safety
[electronic resource] :
providing consumer automotive safety information /
Committee for Study of Consumer Automotive Safety Information, Transportation Research Board, National Research Council.
by
National Research Council (U.S.). Committee for Study of Consumer Automotive Safety Information
ProQuest (Firm)
Series:
Special report (National Research Council (U.S.). Transportation Research Board)
; 248.
Material type:
Text
; Format:
electronic
; Literary form:
Not fiction
Publication details:
Washington, D.C. :
National Academy Press,
1996
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