000 01320nam a22003494a 4500
001 EBC3002391
003 MiAaPQ
006 m o d |
007 cr cn|||||||||
008 050525s2005 ohua sb 001 0 eng
010 _z 2005050106
020 _z0871708167
035 _a(MiAaPQ)EBC3002391
035 _a(Au-PeEL)EBL3002391
035 _a(CaPaEBR)ebr10320384
035 _a(OCoLC)729262390
040 _aMiAaPQ
_cMiAaPQ
_dMiAaPQ
050 4 _aTK7870.15
_b.L425 2005
082 0 4 _a621.381/046
_222
245 0 0 _aLead-free solder interconnect reliability
_h[electronic resource] /
_cedited by Dongkai Shangguan.
260 _aMaterials Park, OH :
_bASM International,
_c2005.
300 _ax, 292 p. :
_bill.
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 _aMicroelectronic packaging
_xReliability.
650 0 _aSolder and soldering.
650 0 _aLead-free electronics manufacturing processes.
655 4 _aElectronic books.
700 1 _aShangguan, Dongkai,
_d1963-
710 2 _aProQuest (Firm)
856 4 0 _uhttps://ebookcentral.proquest.com/lib/nird-ebooks/detail.action?docID=3002391
_zClick to View
999 _c2849
_d2849