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| 001 | EBC3036042 | ||
| 003 | MiAaPQ | ||
| 006 | m o d | | ||
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| 008 | 030814s2003 maua sb 000 0 eng d | ||
| 010 | _z 2003061871 | ||
| 020 | _z1402075898 (alk. paper) | ||
| 035 | _a(MiAaPQ)EBC3036042 | ||
| 035 | _a(Au-PeEL)EBL3036042 | ||
| 035 | _a(CaPaEBR)ebr10078628 | ||
| 035 | _a(OCoLC)923697010 | ||
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_aMiAaPQ _cMiAaPQ _dMiAaPQ |
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| 050 | 4 |
_aTK7895.E42 _bF38 2003 |
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_a004.2/56 _222 |
| 245 | 0 | 0 |
_aFault injection techniques and tools for embedded systems reliability evaluation _h[electronic resource] / _cedited by Alfredo Benso and Paolo Prinetto. |
| 260 |
_aBoston : _bKluwer Academic Publishers, _cc2003. |
||
| 300 |
_axiv, 241 p. : _bill. |
||
| 490 | 1 |
_aFrontiers in electronic testing ; _v23 |
|
| 504 | _aIncludes bibliographical references (p. [231]-241). | ||
| 533 | _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 |
_aEmbedded computer systems _xTesting. |
|
| 650 | 0 |
_aEmbedded computer systems _xReliability. |
|
| 650 | 0 | _aFault location (Engineering) | |
| 655 | 4 | _aElectronic books. | |
| 700 | 1 | _aBenso, Alfredo. | |
| 700 | 1 | _aPrinetto, Paolo. | |
| 710 | 2 | _aProQuest (Firm) | |
| 830 | 0 |
_aFrontiers in electronic testing ; _v23. |
|
| 856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/nird-ebooks/detail.action?docID=3036042 _zClick to View |
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_c9293 _d9293 |
||