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Beam effects, surface topography, and depth profiling in surface analysis

Beam effects, surface topography, and depth profiling in surface analysis [electronic resource] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell. - New York : Plenum Press, c1998. - xix, 430 p. : ill. - Methods of surface characterization ; v. 5 . - Methods of surface characterization ; v. 5. .

Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

ISBN:

LCCN:

Subjects--Topical Terms:
Surfaces (Technology)--Analysis.
Materials--Effect of radiation on.

Index Terms--Genre/Form:
Electronic books.

LC Class. No.: TA418.7 / .B43 1998

Dewey Class. No.: 620/.44

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