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Beam effects, surface topography, and depth profiling in surface analysis [electronic resource] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.

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Material type: Text

Text

TextSeries: Methods of surface characterization ; v. 5.Publication details: New York : Plenum Press, c1998.Description: xix, 430 p. : illSubject(s):

Genre/Form:

Electronic books.

DDC classification:

620/.44 21

LOC classification:

TA418.7 .B43 1998

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Includes bibliographical references and index.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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