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1.
Introduction to software testing / Paul Ammann, Jeff Offutt. by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Cambridge University Press, 2008
Availability: Items available for loan: NIRDPR LIBRARY (1)Call number: 001.6424 AMM P09I.

2.
The essentials of risk management / Michel Crouhy, Dan Galai, Robert Mark by
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: General;
Publication details: New York : McGraw-Hill, c2006
Availability: Items available for loan: NIRDPR LIBRARY (9)Call number: 658.404 CRO P06E, ...

3.
Information literacy assessment [electronic resource] : standards-based tools and assignments / Teresa Y. Neely ; foreword by Hannelore Rader. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Chicago : American Library Association, 2006
Online resources:
Availability: No items available.

4.
Usability testing for library websites [electronic resource] : a hands-on guide / Elaina Norlin, CM! Winters. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Chicago : American Library Association, c2002
Other title:
  • Usability testing for library Web sites
Online resources:
Availability: No items available.

5.
Smarts [electronic resource] : are we hardwired for success? / Chuck Martin, Peg Dawson, Richard Guare. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: New York : Amacom, c2007
Online resources:
Availability: No items available.

6.
ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : Asm International, c2008
Other title:
  • Proceedings of the 34th International Symposium for Testing and Failure Analysis
  • 34th International Symposium for Testing and Failure Analysis
  • Thirty-fourth International Symposium for Testing and Failure Analysis
Online resources:
Availability: No items available.

7.
ISTFA 2002 [electronic resource] : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, 2002
Other title:
  • Proceedings of the 28th International Symposium for Testing and Failure Analysis
  • Conference proceedings from the 28th International Symposium for Testing and Failure Analysis
Online resources:
Availability: No items available.

8.
Tensile testing [electronic resource] / edited by J.R. Davis. by
Edition: 2nd ed.
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, Ohio : ASM International, 2004
Online resources:
Availability: No items available.

9.
ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, c2007
Other title:
  • Proceedings of the 33rd International Symposium for Testing and Failure Analysis
  • 33rd International Symposium for Testing and Failure Analysis
  • Thirty-third International Symposium for Testing and Failure Analysis
Online resources:
Availability: No items available.

10.
ISTFA 2000 [electronic resource] : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, c2000
Other title:
  • Proceedings of the 26th International Symposium or Testing and Failure Analysis
  • Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis
Online resources:
Availability: No items available.

11.
Microelectronic failure analysis [electronic resource] : desk reference : 2001 supplement / prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, c2001
Online resources:
Availability: No items available.

12.
ISTFA 2001 [electronic resource] : proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California / sponsored by EDFAS. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, c2001
Other title:
  • Proceedings of the 27th International Symposium or Testing and Failure Analysis
  • Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis
Online resources:
Availability: No items available.

13.
Understanding how components fail [electronic resource] / Donald J. Wulpi. by
Edition: 2nd ed.
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, 2000 printing, c1999
Online resources:
Availability: No items available.

14.
ISTFA '99 [electronic resource] : proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, c1999
Other title:
  • Proceedings of the 25th International Symposium or Testing and Failure Analysis
  • Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis
Online resources:
Availability: No items available.

15.
Nondestructive testing [electronic resource] : radiography, ultrasonics, liquid penetrant, magnetic particle, eddy current / by Louis Cartz. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, c1995
Online resources:
Availability: No items available.

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ISTFA '97 [electronic resource] : proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California / sponsored by ASM International. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, c1997
Other title:
  • 23rd international symposium for testing and failure analysis
Online resources:
Availability: No items available.

18.
ISTFA '98 [electronic resource] : proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas / sponsored by ISFTA, ASM International. by
Material type: Text Text; Format: electronic ; Literary form: Not fiction
Publication details: Materials Park, OH : ASM International, c1998
Other title:
  • Proceedings of the 24th International Symposium for Testing and Failure Analysis
  • Conference proceedings from the 24th International Symposium for Testing and Failure Analysis
Online resources:
Availability: No items available.

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