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ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by
Material type:  Text; Format:
electronic
; Literary form:
Not fiction
Publication details: Materials Park, OH : Asm International, c2008
Other title:
- Proceedings of the 34th International Symposium for Testing and Failure Analysis
- 34th International Symposium for Testing and Failure Analysis
- Thirty-fourth International Symposium for Testing and Failure Analysis
Availability: No items available.
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ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by
Material type: Text; Format:
electronic
; Literary form:
Not fiction
Publication details: Materials Park, OH : ASM International, c2007
Other title:
- Proceedings of the 33rd International Symposium for Testing and Failure Analysis
- 33rd International Symposium for Testing and Failure Analysis
- Thirty-third International Symposium for Testing and Failure Analysis
Availability: No items available.
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ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. by
Material type: Text; Format:
electronic
; Literary form:
Not fiction
Publication details: Materials Park, Ohio : Asm International, 2009
Availability: No items available.
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ISTFA 2010 [electronic resource] : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International. by
Material type: Text; Format:
electronic
; Literary form:
Not fiction
Publication details: Materials Park, Ohio : ASM International, 2010
Availability: No items available.
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