Results
|
|
1.
|
ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by
Material type:  Text; Format:
electronic
; Literary form:
Not fiction
Publication details: Materials Park, OH : Asm International, c2008
Other title:
- Proceedings of the 34th International Symposium for Testing and Failure Analysis
- 34th International Symposium for Testing and Failure Analysis
- Thirty-fourth International Symposium for Testing and Failure Analysis
Availability: No items available.
|
|
|
2.
|
|
|
|
3.
|
ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by
Material type: Text; Format:
electronic
; Literary form:
Not fiction
Publication details: Materials Park, OH : ASM International, c2007
Other title:
- Proceedings of the 33rd International Symposium for Testing and Failure Analysis
- 33rd International Symposium for Testing and Failure Analysis
- Thirty-third International Symposium for Testing and Failure Analysis
Availability: No items available.
|
|
|
4.
|
|
|
|
5.
|
|
|
|
6.
|
|
|
|
7.
|
|
|
|
8.
|
|
|
|
9.
|
|
|
|
10.
|
|
|
|
11.
|
|
|
|
12.
|
|
|
|
13.
|
|
|
|
14.
|
|
|
|
15.
|
|
|
|
16.
|
ISTFA 2009 [electronic resource] : conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. by
Material type: Text; Format:
electronic
; Literary form:
Not fiction
Publication details: Materials Park, Ohio : Asm International, 2009
Availability: No items available.
|
|
|
17.
|
ISTFA 2010 [electronic resource] : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International. by
Material type: Text; Format:
electronic
; Literary form:
Not fiction
Publication details: Materials Park, Ohio : ASM International, 2010
Availability: No items available.
|
|
|
18.
|
|
|
|
19.
|
|
|
|
20.
|
|
